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Hunayu Four-Point Probe Test Bracket with Probe*1 Suitable for Huanyu Four Point Probe Resistance Tester Sheet Resistance of Uniform Rigid Conductive Semiconductor Film (Bracket B + Probe, E2)
Sale price
$4.00
Regular price $22.00
- Four-Point Probe Test Bracket with Probe only! The probe needs to be used in conjunction with the Resistance Tester. (Resistance Tester is not included.)
- Parameters: (About Straight Line Four-Point Probe) Type: Linear; Material: Nickel Plated Phosphor Copper; Distance Between 2 Neighbouring Probes :2mm; Resultant Force: 4±1N; The Probes Distance Correction Factor Fsp: Refer to Manual
- Replaceable Probe: 6 types of probes are available for selection to meet the application requirements of different testing scenarios. This link is for Model E2 probe
- Application: Suitable for testing the sheet resistance and resistivity of uniform rigid conductive and semiconductor films, such as conductive glass, FTO conductive glass, AZO conductive glass, flexible conductive films, sheet metal layers
- Note: NOT suitable for testing conductive polymer films or silicon wafers with rough surfaces. If you need to test the resistance of materials such as silicon wafers, nano-silver films, graphene films, carbon paste films, confirm with us in advance